International Research journal of Management Science and Technology

  ISSN 2250 - 1959 (online) ISSN 2348 - 9367 (Print) New DOI : 10.32804/IRJMST

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HALL EFFECT MEASUREMENT ON WSE2 SI:NGLE CRYSTALS

    1 Author(s):  RAVINDRAPAL M JOSHI

Vol -  5, Issue- 8 ,         Page(s) : 145 - 149  (2014 ) DOI : https://doi.org/10.32804/IRJMST

Abstract

Abstract : Tungsten diselenide (WSe2) single crystals grown by chemical vapour transport (CVT) technique were comprehensively characterized for Hall Effect Measurement. The Hall Effect Measurements were done by Van Der Pauw technique. The Hall Effect Measurement showed that the crystals were P-type and the value of carrier concentration confirms that WSe2 crystals are semiconductors.

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