International Research journal of Management Science and Technology

  ISSN 2250 - 1959 (online) ISSN 2348 - 9367 (Print) New DOI : 10.32804/IRJMST

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ANALYSIS OF NEODYMIUM DOPED CDSE THIN FILM THROUGH STRUCTURAL, FOURIER TRANSFORM INFRARED SPECTROSCOPY (FTIR) AND EDS APPROACH

    3 Author(s):  K. K. PATHAK, MIMI AKASH PATERIA, KUSUMANJALI DESHMUKH

Vol -  11, Issue- 8 ,         Page(s) : 115 - 120  (2020 ) DOI : https://doi.org/10.32804/IRJMST

Abstract

This paper presents the pure and neodymium doped CdSe thin films were prepared by CBD method at 700C for 6 hours. The different characterization like XRD, EDS, FTIR and electrical are discussed.

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